Ocean Optics - Inventor of the World's First Miniature Spectrometer
Ocean Optics - Inventor of the World's First Miniature Spectrometer
 

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Ocean Optics - Inventor of the World's First Miniature Spectrometer

SpecEl Ellipsometer System

The SpecEl-2000-VIS Ellipsometer measures polarized light reflected from the surface of a substrate to determine the thickness and refractive index of the material as a function of wavelength. The SpecEl is controlled via a PC. Measure refractive index, absorbance and thickness with the touch of a button.

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All-in-one Accurate System

The SpecEl houses an integrated light source, a spectrometer and two polarizers fixed to 70. It also includes a PC with a 32-bit Windows operating system. The SpecEl can detect a single layer as thin as 0.1 nm and up to 5 m thick. In addition, it can provide refractive indices to 0.005.

SpecEl Software and "Recipe" Files

In SpecEl Software, you can configure and save experiment method files for one-step analysis. after creating a "recipe," you can select the recipe to execute the experiment.

Specifications

Wavelength range: 300-1000nm (UV-VIS-NIR) or 400-1000nm (VIS-NIR)
Optical resolution: 1 nm
Accuracy: 0.1 nm
Angle of incidence: 70
Film thickness: 1 nm - 10 m
Beam diameter: 400 x 1200 m
Measurement speed: 7 - 13 seconds

This screen shot from the SpecEl Software demonstrates the Psi and Delta values you can calculate for thickness, refractive index and absorbance.


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