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The
STAN-SSH High-reflectivity Specular Reflectance Standard is a
mirrored, fused-silica standard that can be used as a reference when measuring
surfaces with high specular reflectance values such as optical substrates,
optical coatings, machined metals and semiconductor materials. The STAN-SSH
provides an ~85-90% reflectance across the 200-800 nm wavelength range and
an ~85-98% reflectance across the 800-2500 nm range. The STAN-SSH is available in two versions. The STAN-SSH is $524, and the NIST-traceable STAN-SSH-NIST is $1049. |
The NIST-traceable STAN-SSH-NIST is calibrated to a NIST master (NIST part number NIST38060S, s/n 99G16) with approximately 1.0% accuracy from 250-2500 nm). With the shipment of the NIST-traceable version, the customer will receive a certificate of calibration, a data sheet with the reflectance values as a function of wavelength and a diskette which contains calibration data that can be transferred to Ocean Optics Spectrometer Operating Software.
A periodic recalibration of the STAN-SSH-NIST is recommended. Ocean Optics offers a recalibration service (STAN-SSH-RECAL) for Call for Price. Should the calibrated surface become corrupted, a recoat and calibration service is offered for only $299.
The STAN-SSH substrate measures 1.25" in diameter and is housed in a sturdy 1.5" x 0.75" blue anodized aluminum enclosure and protected by a screw-on top.
The STAN-HOLDER is a convenient accessory option for keeping the standard in place during measurements. STAN-HOLDER is available for $79.

| Substrate Dimensions: | 1.25" outer diameter x 0.25" height |
| Housing Dimensions: | 1.5" outer diameter x 0.75" height |
| Reflectance material: | Mirrored, fused-silica with protective overcoat |
| Reflectivity: |
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WS-1 Diffuse Reflectance Standard
STAN-SSL Low-reflectivity Reflectance Standard