SR4 Series Spectrometers

High SNR and Thermal Wavelength Stability

Versatile and robust, SR4 spectrometers offer high SNR and thermal wavelength stability for applications including plasma monitoring and reflection measurements. The spectrometer is anchored by a CCD-array detector and low-noise electronics for accurate, reliable results.

Documents

Manual

Drawing

Step File

Product Sheet

SR2, SR4, SR6

Comms Protocol

SR4 Series

Disclaimer: Wavelength range and optical resolution specifications are typical values. Actual performance may vary depending on configuration, selected components, and operating conditions.

Group Part Number Wavelength Range Optical resolution (FWHM in nm) Grating Groove Density (lines/mm) Grating Blaze Wavelength Available at Edmund Optics25 μm slit only
5 μm slit10 μm slit25 μm slit50 μm slit100 μm slit200 μm slit
UV-Vis options:SR-4UVV300-XX190 – 910 nm1.171.251.652.554.629.24600300 nmBuy Now
Vis-NIR options:SR-4VN500-XX350 – 1040 nm1.171.251.652.554.629.24600500 nmBuy Now
UV options:SR-4UV220-XX190 – 410 nm0.420.460.600.931.683.361800Holographic
SR-4UV240-XX190 – 535 nm0.580.630.831.282.314.621200Holographic
UV-Vis options:SR-4UVV240-XX190 – 850 nm1.171.251.652.554.629.24600240 nm
SR-4UVV400-XX190 – 910 nm1.171.251.652.554.629.24600400 nm
Ethernet options:SR-4UVV300EN-XX190 – 910 nm1.65600300 nm
Vis options:SR-4VIS400-XX350 – 1040 nm1.171.251.652.554.629.24600400 nm
NIR options:SR-4N750-XX570 – 860 nm0.580.630.831.282.314.621200750 nm
SR-4N1000-XX600 – 1050 nm1.171.251.652.554.629.246001000 nm
Extended-range options:SR-4XR250-XX190 – 1050 nm1.431.542.033.135.6711.34500250 nm
Extended-range Ethernet options:SR-4XR250EN-XX190 – 1050 nm2.03500250 nm
Integration time 3.8 ms – 10 s
SNR (single scan @ 10 ms) 250:1
SNR (max. per second w/High Speed Averaging Mode) 3,000:1
Connectors 16 pin Samtec TFM, RS-232, SMA, USB Type-C
Physical dimensions 88.1 x 63.5 x 31.45 mm
Weight 254 g
Temperature (operation) 0 °C – 55 °C
Temperature (storage) -30 °C – 70 °C
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