Product Details
A reflection/backscatter probe is a compact, versatile sampling option to measure diffuse and specular reflectance, backscatter, or fluorescence from samples as varied as solids, solutions, and powders. Reflection and backscatter measurements can provide quantitative information about the color, appearance, and chemical composition of a sample.
Product Overview
Applications
Ideal for diffuse or specular reflectance from solids, fluorescence, color
Probe Design
6-around-1 fiber bundle design, with 6-fiber leg connecting to light source and single-fiber leg connecting to spectrometer
XSR Assemblies
Probe assembly comprises extreme solarization-resistant fibers (180-900 nm)
SR Assemblies
Probe assembly comprises solarization-resistant fibers (200-1100 nm)
Specifications
Wavelength Coverage
180-900 nm and 200-1100 nm
| Part Number | Wavelength Range | Core Diameter | Fiber Bundle | Jacketing | Bend Radius (cm) | |||||
| 6 Illumination Fibers around 1 Fead Fiber | 6.35 mm OD x 76.2 mm | 3.18 mm OD x 74.2 mm | Silicone Monocoil | Stainless- steel BX | PVDF Zip Tube | LTBR | STBR | |||
| QR230-7-XSR | 180-900 nm | 230 μm | X | X | X | X | 8 | 4 | ||
| QR450-7-XSR | 180-900 nm | 450 μm | X | X | X | X | 16 | 8 | ||
| R200-7-SR | 200-1100 nm | 200 μm | X | X | X | X | X | 8 | 4 | |
| R400-7-SR | 200-1100 nm | 400 μm | X | X | X | X | X | 16 | 8 | |
| QR400-7-SR | 200-1100 nm | 400 μm | X | X | X | X | X | 16 | 8 | |
| QR400-7-SR-BX | 200-1100 nm | 400 μm | X | X | X | X | 16 | 8 | ||
| R600-7-SR-125F | 200-1100 nm | 600 μm | X | X | X | X | X | 24 | 12 | |
| QR600-7-SR125BX | 200-1100 nm | 600 μm | X | X | X | X | X | 24 | 12 | |
| QR600-7-SR-125F | 200-1100 nm | 600 μm | X | X | X | X | X | 24 | 12 | |
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