Reflection/Backscatter Probes

Solarization Resistant, UV-Visible, Visible-NIR, with Reference Leg, Angled, Integrated with Light Source

Reflection/backscatter measurements provide quantitative information about the color, appearance, and chemical composition of samples.

Extreme SR assembly (180 – 800 nm) and SR assembly (200 – 1100 nm)

Probe assembly (300 – 1100 nm)

Probe assembly (400 – 2100 nm)

UV-Visible (300 – 1100 nm) and Visible-NIR (400 – 2100 nm)

Probe assembly (UV-Visible and Visible-NIR)

Diffuse reflectance probe with tungsten halogen light source

Standards, Terms & Conditions, and More.

Product Info, Tech Support, Returns and More.